O Dr. Christophe Diot estará visitando a UFRJ nesta semana e ministrará uma palestra na quarta. O Dr. Diot tem visitado o PESC/COPPE/UFRJ nos últimos anos, e sua palestra será de um tópico que interessa a todos. 

O Dr. Diot já foi Technicolor Chief Scientist e atualmente é CTO da empresa Safran. É sobre atividades em Data Analytics na Safran que o Dr. Diot falará.

Dia: quarta feira, 24 de Maio de 2016

Hora: 15:30 

Sala: H-324A

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Title: Data Analytics at SAFRAN, a world leader in aerospace industry

Abstract: After a short introduction to SAFRAN, we will present the research challenges surrounding the aerospace industry and in particular what we call the Digital Twin. The amount and diversity of data available in the ecosystem is huge and problems are both on the system side (computing massive time series in real-time), and statistical learning (predictive analytics, text mining, weak signal detection, etc.). Digital Twinn is a concept introduced a decade ago which consists in running a digital copy of each aircraft in the cloud to anticipate failure, maintenance, and in the longer term impact aircraft design and material behavioral models.

Short Bio of Dr. Diot

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Christophe Diot received a Ph.D. degree in Computer Science from INP Grenoble in 1991. With INRIA Sophia-Antipolis (1993-1998), Diot pioneered diffserv, single source multicast, and peer-to-peer online games. At Sprint (1998-2003), he pioneered Internet measurements. Diot was with Intel Research in Cambridge UK from 2003 to 2005, At Thomson/Technicolor (2005-2015), he launched two successful research labs in Paris and Palo Alto (with major contribution on privacy, recommendation, and content delivery architectures) before serving as the Technicolor Chief Scientist. Diot joined SAFRAN in 2015 as the CTO of Safran Analytics, where he is in charge of building big data plaforms and developing analytics silution for the Safran Group. He has around 40 patents and more than 300 publications in major conferences and journals, and is an ACM fellow.